Nanotechnologies – a Reliability Nightmare
主讲人：Dr. Hans Manhaeve
This presentation addresses deployment of nanotechnologies from a reliability related perspective. Smaller dimensions make semiconductor devices more sensitive to degradation mechanisms such as EM (Electro Migration), TDDB (Time Dependent Dielectric Breakdown), HCI (Hot Carrier Instabilities), NBTI/PBTI (Bias Temperature Instabilities). A good understanding and more important a good qualification of the resulting effects of these degradation mechanisms on operation and performance is important to devise suitable mitigation measures as well as to know how long a circuit may last given certain operating conditions. The presentation will focus on these degradation mechanisms and their qualification from a test and measurement perspective. In relation to that it will also focus on aspects related to making measurements and interpreting instrument specifications in function of proper qualification of measurement results..
Hans Manhaeve received a Ph.D. Degree in Electronic Engineering, from the University of Hull (UK) in 1997. Previously he received an MSc Degree in Electronics and Micro-Electronics from the Technical University of Oostende, Belgium in 1987 and holds teaching and management certificates.
In 1999 he joined IMEC as a researcher and later that year he set up the KHBO/IMEC spin-off company Q-Star Test, focusing on marketing structural and (supply) current based test solutions that evolved into Ridgetop Europe and that is now a subsidiary of Ridgetop Group. He is currently acting as CEO of Ridgetop Europe and as CTO for Ridgetop Group. Next to that he is guest professor at Technical University of Oostende, and is an active member of the IEEE-CS ETTTC (European group of the Test Technology Technical Committee) as well as of the TTTC.
As a recognized expert in advanced diagnostics and prognostics, testability of electronic devices and systems, he delivered active contributions to several national and international conferences and workshops. He authored/co-authored more than 100 papers of which more than 50 papers on current monitors and current-based test strategies and holds several patents on IDDQ / IDDT measurement solutions and related test techniques, strategies and methods